"Detailed Analysis of FIBL in MOS Transistors with High-K Gate Dielectrics."

Nihar R. Mohapatra, Madhav P. Desai, V. Ramgopal Rao (2003)

Details and statistics

DOI: 10.1109/ICVD.2003.1183121

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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