"Easily Testable Realization of GRM and ESOP Networks for Detecting ..."

Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya (2004)

> Home

Details and statistics

DOI: 10.1109/ICVD.2004.1260968

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/RahamanDB04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/RahamanDB04
Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
Easily Testable Realization of GRM and ESOP Networks for Detecting Stuck-at and Bridging Faults. VLSI Design 2004: 487-492

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.