"Automatic Test Pattern Generation for Sequential Circuits Using Genetic ..."

V. Rajesh, Ajai Jain (1998)

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DOI: 10.1109/ICVD.1998.646616

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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V. Rajesh, Ajai Jain:
Automatic Test Pattern Generation for Sequential Circuits Using Genetic Algorithms. VLSI Design 1998: 270-273

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