"Built-in Self-test Technique for Selective Detection of Neighbourhood ..."

Rajeshwar S. Sable et al. (2004)

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DOI: 10.1109/ICVD.2004.1261019

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rajeshwar S. Sable, Ravindra P. Saraf, Rubin A. Parekhji, Arun N. Chandorkar:
Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories. VLSI Design 2004: 753-756

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