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"Optimization of Test Accesses with a Combined BIST and External Test Scheme."
Makoto Sugihara, Hiroto Yasuura (2002)
- Makoto Sugihara, Hiroto Yasuura:
Optimization of Test Accesses with a Combined BIST and External Test Scheme. ASP-DAC/VLSI Design 2002: 683-688
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