"Unified Model for Sub-Bandgap and Conventional Impact Ionization in RF SOI ..."

Chandan Yadav et al. (2016)

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DOI: 10.1109/VLSID.2016.85

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chandan Yadav, Anupam Dutta, Saurabh Sirohi, Ethirajan Tamilmani, Yogesh Singh Chauhan:
Unified Model for Sub-Bandgap and Conventional Impact Ionization in RF SOI MOSFETs with Improved Simulator Convergence. VLSID 2016: 328-333

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