"Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm ..."

Shengqi Yang et al. (2005)

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DOI: 10.1109/ICVD.2005.41

access: closed

type: Conference or Workshop Paper

metadata version: 2025-08-18

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Shengqi Yang, Wayne H. Wolf, Narayanan Vijaykrishnan, Yuan Xie, Wenping Wang:
Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits. VLSI Design 2005: 165-170

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