"High Bit Cost Scalability and Reliable Cell Characteristics for 7th ..."

Kyungmoon Kim et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185404

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-04

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Kyungmoon Kim, Yujeong Seo, Sejun Park, Woojae Jang, Dongho Yoo, Joonsung Lim, Il-Han Park, Jaeduk Lee, Kyungyoon Noh, Sujin Ahn, Sunghoi Hur:
High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash. VLSI Technology and Circuits 2023: 1-2

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