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"Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for ..."
Liang Zhao et al. (2022)
- Liang Zhao, Z. Chen, Dan Manea, S. Li, J. Li, Y. Zhu, Z. Sui, Zhichao Lu:
Highly Reliable 40nm Embedded Dual-Interface-Switching RRAM Technology for Display Driver IC Applications. VLSI Technology and Circuits 2022: 316-317
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