"First Study of the Charge Trapping Aggravation Induced by ..."

Zuopu Zhou et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185236

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-28

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Zuopu Zhou, Leming Jiao, Zijie Zheng, Xiaolin Wang, Dong Zhang, Kai Ni, Xiao Gong:
First Study of the Charge Trapping Aggravation Induced by Anti-Ferroelectric Switching in the MFIS Stack. VLSI Technology and Circuits 2023: 1-2

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