"19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a ..."

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type: Editorship

metadata version: 2019-10-16

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19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. IEEE Computer Society 2001, ISBN 0-7695-1122-8 [contents]

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