"Wafer-level process variation-driven probe-test flow selection for test ..."

Ali Ahmadi et al. (2016)

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DOI: 10.1109/VTS.2016.7477263

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS 2016: 1-6

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