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"Reduction of diagnostic fail data volume and tester time using a dynamic ..."

Shraddha Bodhe et al. (2016)

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DOI: 10.1109/VTS.2016.7477280

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/BodheAGMPV16
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  persistent URL:
  - https://dblp.org/rec/conf/vts/BodheAGMPV16
Shraddha Bodhe, M. Enamul Amyeen, Clariza Galendez, Houston Mooers, Irith Pomeranz, Srikanth Venkataraman:
Reduction of diagnostic fail data volume and tester time using a dynamic N-cover algorithm. VTS 2016: 1-6

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