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"Can Defect-Tolerant Chips Better Meet the Quality Challenge?"

R. L. Campbell et al. (1996)

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DOI: 10.1109/VTS.1996.10016

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/CampbellKLMNO96
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  - https://dblp.org/rec/conf/vts/CampbellKLMNO96
R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu:
Can Defect-Tolerant Chips Better Meet the Quality Challenge? VTS 1996: 362-363

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