


default search action
"Modeling and Testing of SRAM for New Failure Mechanisms Due to Process ..."
Qikai Chen et al. (2005)
- Qikai Chen, Hamid Mahmoodi-Meimand

, Swarup Bhunia
, Kaushik Roy:
Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS. VTS 2005: 292-297

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID













