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"Genetic-algorithm-based test generation for current testing of bridging ..."

Terry Lee et al. (1996)

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DOI: 10.1109/VTEST.1996.510893

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vts/LeeHRP96
Terry Lee, Ibrahim N. Hajj, Elizabeth M. Rudnick, Janak H. Patel:
Genetic-algorithm-based test generation for current testing of bridging faults in CMOS VLSI circuits. VTS 1996: 456-462

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