"Partial Reset and Scan for Flip-Flops Based on States Requirement for Test ..."

Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen (1998)

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DOI: 10.1109/VTEST.1998.670888

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen:
Partial Reset and Scan for Flip-Flops Based on States Requirement for Test Generation. VTS 1998: 341-347

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