"Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ..."

W.-A. Lin, C.-C. Lee, J.-L. Huang (2011)

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DOI: 10.1109/VTS.2011.5783740

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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W.-A. Lin, C.-C. Lee, J.-L. Huang:
Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs. VTS 2011: 315-320

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