"Efficient built-in self test of regular logic characterization vehicles."

Ben Niewenhuis, Ronald D. Blanton (2015)

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DOI: 10.1109/VTS.2015.7116303

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ben Niewenhuis, Ronald D. Blanton:
Efficient built-in self test of regular logic characterization vehicles. VTS 2015: 1-6

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