"Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge ..."

Ivan de Paúl et al. (2001)

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DOI: 10.1109/VTS.2001.923451

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden:
Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. VTS 2001: 286-291

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