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"A unified test architecture for on-line and off-line delay fault detections."

Songwei Pei, Huawei Li, Xiaowei Li (2011)

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DOI: 10.1109/VTS.2011.5783733

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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Songwei Pei, Huawei Li, Xiaowei Li:
A unified test architecture for on-line and off-line delay fault detections. VTS 2011: 272-277

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