"A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq."

Masaru Sanada (1996)

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DOI: 10.1109/VTEST.1996.510856

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
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Masaru Sanada:
A CAD-based approach to failure diagnosis of CMOS LSI's using abnormal Iddq. VTS 1996: 186-191

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