"Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate ..."

Manish Sharma, Janak H. Patel, Jeff Rearick (2003)

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DOI: 10.1109/VTEST.2003.1197628

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Manish Sharma, Janak H. Patel, Jeff Rearick:
Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture. VTS 2003: 15-21

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