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"A Simple and Efficient Method for Generating Compact IDDQ Test Set for ..."

Tsuyoshi Shinogi, Terumine Hayashi (1998)

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DOI: 10.1109/VTEST.1998.670857

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ShinogiH98
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ShinogiH98
Tsuyoshi Shinogi, Terumine Hayashi:
A Simple and Efficient Method for Generating Compact IDDQ Test Set for Bridging Fault. VTS 1998: 112-117

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