"Efficient Path Selection for Delay Testing Based on Partial Path Evaluation."

Seiichiro Tani et al. (1998)

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DOI: 10.1109/VTEST.1998.670867

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Seiichiro Tani, Mitsuo Teramoto, Tomoo Fukazawa, Kazuyoshi Matsuhiro:
Efficient Path Selection for Delay Testing Based on Partial Path Evaluation. VTS 1998: 188-193

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