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"Automatic generation of memory built-in self-repair circuits in SOCs for ..."
Tsu-Wei Tseng, Chih-Sheng Hou, Jin-Fu Li (2010)
- Tsu-Wei Tseng, Chih-Sheng Hou, Jin-Fu Li:
Automatic generation of memory built-in self-repair circuits in SOCs for minimizing test time and area cost. VTS 2010: 21-26
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