BibTeX record conf/vts/UezonoTSHMOS10

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@inproceedings{DBLP:conf/vts/UezonoTSHMOS10,
  author    = {Takumi Uezono and
               Tomoyuki Takahashi and
               Michihiro Shintani and
               Kazumi Hatayama and
               Kazuya Masu and
               Hiroyuki Ochi and
               Takashi Sato},
  title     = {Path clustering for adaptive test},
  booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  pages     = {15--20},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://doi.org/10.1109/VTS.2010.5469626},
  doi       = {10.1109/VTS.2010.5469626},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/UezonoTSHMOS10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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