"At-speed interconnect testing and test-path optimization for 2.5D ICs."

Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik (2014)

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DOI: 10.1109/VTS.2014.6818770

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ran Wang, Krishnendu Chakrabarty, Sudipta Bhawmik:
At-speed interconnect testing and test-path optimization for 2.5D ICs. VTS 2014: 1-6

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