"Framework-supported mechanism of testing algorithms for assessing memory ..."

Iván García-Magariño et al. (2019)

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DOI: 10.1109/WF-IOT.2019.8767297

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Iván García-Magariño, Marlon Cárdenas, Jorge J. Gómez-Sanz, Juan L. Pérez Díez:
Framework-supported mechanism of testing algorithms for assessing memory and detecting disorientation from IoT sensors. WF-IoT 2019: 899-904

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