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"0day Anomaly Detection Made Possible Thanks to Machine Learning."

Philippe Owezarski, Johan Mazel, Yann Labit (2010)

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DOI: 10.1007/978-3-642-13315-2_27

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  - conf/wwic/OwezarskiML10
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  - https://dblp.org/rec/conf/wwic/OwezarskiML10
Philippe Owezarski, Johan Mazel, Yann Labit:
0day Anomaly Detection Made Possible Thanks to Machine Learning. WWIC 2010: 327-338

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