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"Understanding Uncertainty in Measurement and Accommodating its Impact in ..."

Jeeeun Kim et al. (2017)

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DOI: 10.1145/3064663.3064690

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/ACMdis/KimGYHM17
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  - https://dblp.org/rec/conf/ACMdis/KimGYHM17
Jeeeun Kim, Anhong Guo, Tom Yeh, Scott E. Hudson, Jennifer Mankoff:
Understanding Uncertainty in Measurement and Accommodating its Impact in 3D Modeling and Printing. Conference on Designing Interactive Systems 2017: 1067-1078

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