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"AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs ..."
Sudarshan Bahukudumbi et al. (2007)
- Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar:
AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. ASP-DAC 2007: 823-828
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