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"I_DDQ Test Method Based on Wavelet Transformation for Noisy Current ..."

Masaki Hashizume et al. (2004)

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DOI: 10.1109/ATS.2004.50

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/HashizumeYYTKMT04
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  persistent URL:
  - https://dblp.org/rec/conf/ats/HashizumeYYTKMT04
Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada:
I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium 2004: 112-117

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