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"A Memory Fault Simulator for Radiation-Induced Effects in SRAMs."

Paolo Rech et al. (2010)

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DOI: 10.1109/ATS.2010.26

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/RechBGPVD10
Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo:
A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. Asian Test Symposium 2010: 100-105

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