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ORCID"Capture in Turn Scan for Reduction of Test Data Volume, Test Application ..."
Zhiqiang You et al. (2010)
- Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara:
Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. Asian Test Symposium 2010: 371-374
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