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"An MRF-based statistical deformation model for morphological image analysis."

Jesus J. Caban, Penny Rheingans, Terry S. Yoo (2010)

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DOI: 10.1109/CVPRW.2010.5543441

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/cvpr/CabanRY10
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  persistent URL:
  - https://dblp.org/rec/conf/cvpr/CabanRY10
Jesus J. Caban, Penny Rheingans, Terry S. Yoo:
An MRF-based statistical deformation model for morphological image analysis. CVPR Workshops 2010: 31-38

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