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"On Characterizing Near-Threshold SRAM Failures in FinFET Technology."
Shrikanth Ganapathy et al. (2017)
- Shrikanth Ganapathy, John Kalamatianos, Keith Kasprak, Steven Raasch:
On Characterizing Near-Threshold SRAM Failures in FinFET Technology. DAC 2017: 53:1-53:6
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