Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A fast and robust failure analysis of memory circuits using adaptive ..."

Xiao Shi et al. (2018)

> Home

Details and statistics

DOI: 10.1145/3195970.3195972

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-30

- view
  authority control:
- export record
  dblp key:
  - conf/dac/ShiLYH18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/ShiLYH18
Xiao Shi, Fengyuan Liu, Jun Yang, Lei He:
A fast and robust failure analysis of memory circuits using adaptive importance sampling method. DAC 2018: 134:1-134:6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.