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"Erkennung deformierbarer Konturen und Oberflächen in verrauschten ..."

Marcus Schreckenberg, G. von Dziembowski, Dietrich Meyer-Ebrecht (1998)

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DOI: 10.1007/978-3-642-72282-0_23

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-25

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  dblp key:
  - conf/dagm/SchreckenbergDM98
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  - https://dblp.org/rec/conf/dagm/SchreckenbergDM98
Marcus Schreckenberg, G. von Dziembowski, Dietrich Meyer-Ebrecht:
Erkennung deformierbarer Konturen und Oberflächen in verrauschten Bilddaten durch Einsatz modellgekoppelter anisotroper Merkmalsextraktoren. DAGM-Symposium 1998: 219-226

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