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"Cost-effective IR-drop failure identification and yield recovery through a ..."

Mingjing Chen, Alex Orailoglu (2010)

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DOI: 10.1109/DATE.2010.5457236

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - https://dblp.org/rec/conf/date/ChenO10
Mingjing Chen, Alex Orailoglu:
Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme. DATE 2010: 63-68

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