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"Test Pattern for Supply Current Test of Open Defects by Applying ..."

Hiroyuki Yotsuyanagi et al. (2001)

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DOI: 10.1109/DFTVS.2001.966781

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada:
Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287-

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