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"Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells."
Nivard Aymerich et al. (2011)
- Nivard Aymerich, Shrikanth Ganapathy, Antonio Rubio, Ramon Canal, Antonio González:
Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells. ACM Great Lakes Symposium on VLSI 2011: 277-282
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