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"Temperature-gradient based test scheduling for 3D stacked ICs."

Nima Aghaee, Zebo Peng, Petru Eles (2013)

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DOI: 10.1109/ICECS.2013.6815440

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  dblp key:
  - conf/icecsys/AghaeePE13
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Nima Aghaee, Zebo Peng, Petru Eles:
Temperature-gradient based test scheduling for 3D stacked ICs. ICECS 2013: 405-408

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