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"An SRAM based testing methodology for yield analysis of semiconductor ICs."

Jannah Al-Hashimi et al. (2013)

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DOI: 10.1109/ICECS.2013.6815443

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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  - conf/icecsys/Al-HashimiTAAS13
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Jannah Al-Hashimi, Seepsa Tomoq, Khaldoon Abugharbieh, Yazan Al-Qudah, Mustafa Shihadeh:
An SRAM based testing methodology for yield analysis of semiconductor ICs. ICECS 2013: 417-420

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