"Characterization test plan for a PCB to DIE transition in a fcCBGA ..."

Joseph Romen Cubillo et al. (2007)

Details and statistics

DOI: 10.1109/ICECS.2007.4511065

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics