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"A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide ..."

Tzu-Ming Wang, Wan-Yi Shen, Ming-Dou Ker (2007)

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DOI: 10.1109/ICECS.2007.4510966

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Tzu-Ming Wang, Wan-Yi Shen, Ming-Dou Ker:
A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide Reliability in Low-Voltage CMOS Processes. ICECS 2007: 206-209

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