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"Exploring test opportunities for memory and interconnects in 3D ICs."

Mottaqiallah Taouil, Mihai Lefter, Said Hamdioui (2013)

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DOI: 10.1109/IDT.2013.6727132

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Mottaqiallah Taouil, Mihai Lefter, Said Hamdioui:
Exploring test opportunities for memory and interconnects in 3D ICs. IDT 2013: 1-6

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