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"Automated Vulnerability Detection in Embedded Devices."

Danjun Liu et al. (2018)

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DOI: 10.1007/978-3-319-99277-8_17

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-18

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  - conf/ifip11-9/LiuTWXY18
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Danjun Liu, Yong Tang, Baosheng Wang, Wei Xie, Bo Yu:
Automated Vulnerability Detection in Embedded Devices. IFIP Int. Conf. Digital Forensics 2018: 313-329

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