"Circuit Failure Prediction Enables Robust System Design Resilient to Aging ..."

Subhasish Mitra (2007)

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DOI: 10.1109/IOLTS.2007.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Subhasish Mitra:
Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. IOLTS 2007: 123

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