"A Hamming Distance Based Test Pattern Generator with Improved Fault Coverage."

Dhiraj K. Pradhan, Dimitri Kagaris, Rohit Gambhir (2005)

Details and statistics

DOI: 10.1109/IOLTS.2005.6

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics